Hey I messaged them a bit, this is an undergraduate project with no budget (so a MOSFET tester is out of budget). I also suggested a sort of sweep method using an MCU and some op-amp glue, but I don't think they have sufficient background to get this kind of thing working yet (in fact I barely do, so probably it won't 'just work' with whatever I came up with off the top of my head).
What I was thinking is perhaps they can set Vds and Vgs to fixed values such that a particular MOSFET conducts a fixed current, e.g. 100mA, somewhere near-ish the start of the linear region. Then record the Vgs required to achieve this current for each of a set of MOSFETs, say a few dozen (because of part variation).
Then after exposing them to varying amounts of radiation (a few for each exposure level), put them back in the same test conditions and measure how the output current has changed, what Vgs will restore the same current, draw some graphs, discuss the advantages and disadvantages relative to the Vth method with regards to radiation dosimetry, conclude, and call it a day.
Think it would work? No need for an MCU or signals processing this way, so the science can get done with the tools they have.
Also I never had free access to strong radiations sources in undergrad, so am a little jealous. I barely got to use tritium, and that sparingly.